首页 | 师资队伍 | 科研人员

科研人员

刘显强助理研究员,硕士生导师

2002 年毕业于沈阳大学机械工程学院。 2003年-2008年在北京工业大学固体微结构与性能研究所获得博士学位,同年留校工作。
研究方向:功能材料结构与物性关系及相变机制研究,第一性原理计算研究。
主要学术成果
X. Q. Liu, X. B. Li, L. Zhang,1 Y. Q. Cheng, Z. G. Yan,1 M. Xu, X. D. Han,1, S. B. Zhang, Z. Zhang, and E. Ma, New Structural Picture of the Ge2Sb2Te5Phase-Change Alloy,Phys. Rev. Lett.106, 025501 (2011).
? Xian-Bin Li,X. Q. Liu, Xin Liu, Dong Han, Z. Zhang, X. D. Han, Hong-Bo Sun, and S. B. Zhang, Role of Electronic Excitation in the Amorphization of Ge-Sb-Te Alloys,Phys. Rev. Lett.107, 015501 (2011).
?  Y. Cheng, X.D. Han,X.Q. Liu, K. Zheng, Z. Zhang, T. Zhang, Z.T. Song, B. Liu and S.L. Feng , Self-Extrusion of Te-Nanowire from Si-Sb-Te Thin Films.Appl. Phys. Lett.93, 183113 (2008).
? X. D. Han, S. L. Zheng, Y. F. Zhang, K. Zheng, S. B. Zhang, Z. Zhang, X. N. Zhang,X. Q. Liu, G. Chen, Y. J. Hao, X. Y. Guo, Polarization driven covalently-bonded octahedral-twinning and backbone-peripheral-helical nanoarchitectures,Nano Letters8, 2258-2264 (2008).
X. Q. Liu, X. D. Han, Z. Zhang, L. F. Ji and Y. J. Jiang, The Crystal Structure of High Temperature Phase Ta2O5,Acta. Materialia55, 2385 (2007).
X. Q. Liu, X. D. Han, Z. Zhang, L. F. Ji and Y. J. Jiang, Structural correlations of the enhancement of dielectric permittivity in the ( Ta2O5)0.92(TiO2)0.08system,Appl. Phys. Lett.,90, 211904 (2007).
? X. D. Han, Y. F. Zhang,X. Q. Liu, Z. Zhang, Y. J. Hao and X. Y. Guo, Lattice bending, disordering, and amorphization induced plastic,Journal of Applied Physics98,124307 (2005).
刘显强,韩晓东,张泽, Ta2O5-TiO2调制结构和介电性能相关性 , 电子显微学报26p434~440, 2007.
刘显强,韩晓东,张泽,季凌飞,蒋毅坚,Ta2O5高温相结构,电子显微学报24,p347~347, 2005.